METHOD AND APPARATUS FOR VACUUM MEASUREMENT DURING DIE CASTING

Title:

METHOD AND APPARATUS FOR VACUUM MEASUREMENT DURING DIE CASTING

Document Type and Number:

WIPO Patent Application WO/2005/107980

Kind Code:

A1

Abstract:

The method and apparatus of the present invention utilizes a computer and at least one pressure transducer for monitoring vacuum parameters in the operation of a die casting machine. A profile of the vacuum measurements are generated as a function of time and are graphically displayed on a shot monitor. The computer is optionally programmed with operator defined traces for comparison with acquired data profiles to segregate parts based on the comparison values.

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Inventors:

BROWN ZACHARY (US)
MUSSER MARK (US)
BIGELOW JOSEPH (US)

Application Number:

PCT/US2004/041848

Publication Date:

November 17, 2005

Filing Date:

December 15, 2004

Export Citation:

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Assignee:

SPX CORP (US)
BROWN ZACHARY (US)
MUSSER MARK (US)
BIGELOW JOSEPH (US)

International Classes:

B22D17/14; B22D17/32; (IPC1-7): B22D17/32; B22D17/14

Foreign References:

US5511605A	1996-04-30
US5782287A	1998-07-21
US5979536A	1999-11-09
DE10140657C1	2002-11-07

Other References:

PATENT ABSTRACTS OF JAPAN vol. 1997, no. 07 31 July 1997 (1997-07-31)
PATENT ABSTRACTS OF JAPAN vol. 2003, no. 12 5 December 2003 (2003-12-05)

Attorney, Agent or Firm:

Sheehan, Kenneth (Washington Square Suite 1100, 1050 Connecticut Avenu, Washington DC, US)

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