Title:
METHOD FOR CALIBRATING MAGNETIC FIELD OF THERMOMETER HAVING MAGNETIC FIELD DEPENDENCE
Document Type and Number:
WIPO Patent Application WO/2002/050502
Kind Code:
A1
Abstract:
A method capable of easily performing magnetic field calibration of a thermometer having magnetic field dependence. The temperature dependence of a physical quantity of a substance having a physical quantity which is independent on a magnetic field is measured (Step 1), the substance and the thermometer having the magnetic field dependence and to be subjected to magnetic field calibration are maintained at the same temperature for each of the temperatures in the magnetic field (Step 2), the temperature indicated by the thermometer is obtained, and the physical quantity is measured by a measuring method having no magnetic field dependence (Step 3), the temperature is determined from the physical quantity and the temperature dependence of the physical quantity, and the magnetic field calibration value of the thermometer having the magnetic field dependence is obtained from the temperature and the indicated temperature at each temperature in the magnetic field (Step 4). In such steps, since the temperature dependence of the specific heat having no magnetic field dependence is measured with no external magnetic field, the temperature dependence characteristic curve of the specific heat can be easily obtained, and the correct temperature can be obtained from the specific heat by utilizing the temperature dependence characteristic curve. This method is considerably useful if applied to an engineering field needing the temperature measurement at a very low temperature and in a high magnetic field.
Inventors:
TANAKA YASUMOTO (JP)
IYO AKIRA (JP)
SHIRAKAWA NAOKI (JP)
IKEDA SHINNICHI (JP)
IHARA HIDEO (JP)
TOKIWA KAZUYASU (JP)
WATANABE TSUNEO (JP)
KAMIMURA AKIRA (JP)
MCARTHUR III JOHN ELLIS (JP)
IYO AKIRA (JP)
SHIRAKAWA NAOKI (JP)
IKEDA SHINNICHI (JP)
IHARA HIDEO (JP)
TOKIWA KAZUYASU (JP)
WATANABE TSUNEO (JP)
KAMIMURA AKIRA (JP)
MCARTHUR III JOHN ELLIS (JP)
Application Number:
PCT/JP2001/011100
Publication Date:
June 27, 2002
Filing Date:
December 18, 2001
Export Citation:
Assignee:
JAPAN SCIENCE & TECH CORP (JP)
NAT INST OF ADVANCED IND SCIEN (JP)
QUANTUM DESIGN JAPAN INC (JP)
TANAKA YASUMOTO (JP)
IYO AKIRA (JP)
SHIRAKAWA NAOKI (JP)
IKEDA SHINNICHI (JP)
IHARA HIDEO (JP)
TOKIWA KAZUYASU (JP)
WATANABE TSUNEO (JP)
KAMIMURA AKIRA (JP)
MCARTHUR III JOHN ELLIS (JP)
NAT INST OF ADVANCED IND SCIEN (JP)
QUANTUM DESIGN JAPAN INC (JP)
TANAKA YASUMOTO (JP)
IYO AKIRA (JP)
SHIRAKAWA NAOKI (JP)
IKEDA SHINNICHI (JP)
IHARA HIDEO (JP)
TOKIWA KAZUYASU (JP)
WATANABE TSUNEO (JP)
KAMIMURA AKIRA (JP)
MCARTHUR III JOHN ELLIS (JP)
International Classes:
G01K7/36; G01K15/00; (IPC1-7): G01K15/00
Foreign References:
| JPH07260594A | 1995-10-13 | |||
| JPH08136361A | 1996-05-31 | |||
| JPH08152365A | 1996-06-11 |
Attorney, Agent or Firm:
Hirayama, Kazuyuki (Shinjukugyoen Bldg. 3-10 Shinjuku 2-chome Shinjuku-ku, Tokyo, JP)
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