Title:
METHOD FOR COMPILING LOAD SPECTRUM OF RELIABILITY TEST FOR HIGH-SPEED BEARING OF ELECTRIC DRIVE SYSTEM
Document Type and Number:
WIPO Patent Application WO/2022/028419
Kind Code:
A1
Abstract:
A method for compiling a load spectrum of a reliability test for a high-speed bearing of an electric drive system. On the basis of load data of the full life cycle of an electric drive system, same is associated with a high-speed bearing failure dominant load, and action frequencies of load classes are counted by using a multi-dimensional load joint counting method; a mechanical equilibrium equation for a bearing is constructed; a load class of a reliability test is determined by means of the damage contribution distribution of different load classes and a cumulative damage contribution distribution; the time of the load class of the reliability test is determined according to the principles of overall frequency consistency and damage consistency; and in view of an extreme load working condition, a load spectrum of the reliability test for a high-speed bearing is finally constructed. The constructed load spectrum of the reliability test is associated with an actual failure mode, such that the reliability level of a high-speed bearing can be effectively verified, and the time for the reliability test is shortened, thereby providing support for the high-quality development of the high-speed bearing.
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Inventors:
ZHAO LIHUI (CN)
WANG ZHEN (CN)
LI QICHEN (CN)
LIU LONGJIE (CN)
FENG JINZHI (CN)
ZHENG SONGLIN (CN)
GAO DAWEI (CN)
WENG SHUO (CN)
WANG ZHEN (CN)
LI QICHEN (CN)
LIU LONGJIE (CN)
FENG JINZHI (CN)
ZHENG SONGLIN (CN)
GAO DAWEI (CN)
WENG SHUO (CN)
Application Number:
PCT/CN2021/110328
Publication Date:
February 10, 2022
Filing Date:
August 03, 2021
Export Citation:
Assignee:
UNIV OF SHANGHAI FOR SCIENCE AND TECHNOLOGY (CN)
International Classes:
G06F30/17
Foreign References:
CN111914370A | 2020-11-10 | |||
CN103674571A | 2014-03-26 | |||
US20040249619A1 | 2004-12-09 | |||
CN110502816A | 2019-11-26 |
Attorney, Agent or Firm:
SHANGHAI BANGDE PATENT AGENCY (CN)
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