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Title:
METHOD AND DEVICE FOR CONTROL OF THE DATA FLOW ON APPLICATION OF RETICLES IN A SEMICONDUCTOR COMPONENT PRODUCTION
Document Type and Number:
WIPO Patent Application WO2003025678
Kind Code:
A3
Abstract:
The invention relates to a method and a device for control of the data flow on application of reticles in a semiconductor component production, characterised in that the reticles each have a unique structured reticle data set, whereby the content of the reticle data set can be automatically altered and/or completed, depending on the production process for a semiconductor component. The application of reticles in a semiconductor component production can thus be efficiently controlled.

Inventors:
ALBRECHT THOMAS (DE)
HAASE NORBERT (DE)
HAFFNER HENNING (DE)
JAEHNERT CARMEN (DE)
KRONEFELD OLAF (DE)
STIEGLER MANFRED (DE)
Application Number:
PCT/DE2002/003196
Publication Date:
October 09, 2003
Filing Date:
August 28, 2002
Export Citation:
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Assignee:
INFINEON TECHNOLOGIES AG (DE)
ALBRECHT THOMAS (DE)
HAASE NORBERT (DE)
HAFFNER HENNING (DE)
JAEHNERT CARMEN (DE)
KRONEFELD OLAF (DE)
STIEGLER MANFRED (DE)
International Classes:
G03F1/00; G03F7/20; H01L21/027; (IPC1-7): G03F7/20
Foreign References:
US6077632A2000-06-20
US5396312A1995-03-07
EP1184724A12002-03-06
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