Title:
METHOD AND DEVICE FOR EVALUATING USED ELECTRONIC APPARATUS
Document Type and Number:
WIPO Patent Application WO/2022/240045
Kind Code:
A1
Abstract:
Disclosed are a method and device for evaluating a used electronic apparatus. A method for evaluating an apparatus to be evaluated according to an embodiment of the present invention may comprise the steps of: receiving, from the apparatus to be evaluated, inner state analysis result information about the apparatus to be evaluated; determining an initial price by using the received inner state analysis result information; transmitting the determined initial price to the apparatus to be evaluated and a user apparatus; requesting that the user apparatus perform an evaluation of the outer appearance of the apparatus to be evaluated; receiving, from the user apparatus, a response indicating that the evaluation of the outer appearance of the apparatus to be evaluated will be performed; receiving, from the user apparatus, a plurality of images captured of the outer appearance of the apparatus to be evaluated; determining a final price of the apparatus to be evaluated using results of analyzing the received images and the determined initial price; and transmitting the determined final price to the user apparatus.
Inventors:
JI CHANG HWAN (KR)
CHO SUNG LACK (KR)
CHO SUNG LACK (KR)
Application Number:
PCT/KR2022/006296
Publication Date:
November 17, 2022
Filing Date:
May 03, 2022
Export Citation:
Assignee:
MINTIT CO LTD (KR)
International Classes:
G06Q30/06; G06Q30/02; G06Q50/28
Foreign References:
| KR20210004197A | 2021-01-13 | |||
| KR102054298B1 | 2019-12-10 | |||
| KR20160084944A | 2016-07-15 | |||
| KR20200059914A | 2020-05-29 | |||
| JP6050922B1 | 2016-12-21 |
Attorney, Agent or Firm:
MUHANN PATENT & LAW FIRM (KR)
Download PDF: