METHOD OF EVALUATING EVENNESS OF SUPLATAST TOSILATE CRYSTAL, EVEN CRYSTAL, AND PROCESS FOR PRODUCING THE SAME

Title:

METHOD OF EVALUATING EVENNESS OF SUPLATAST TOSILATE CRYSTAL, EVEN CRYSTAL, AND PROCESS FOR PRODUCING THE SAME

Document Type and Number:

WIPO Patent Application WO/2006/006616

Kind Code:

A1

Abstract:

A method of evaluating the evenness of suplatast tosilate crystals; and stable crystals having evenness in optical purity. The method of evaluating the evenness of suplatast tosilate crystals is characterized by comprising (a) a step in which a solvent is added to the suplatast tosilate crystals to dissolve up to 3% of the crystals and part of the supernatant of the resultant suspension is taken out and examined for optical purity and (b) a step in which a solvent is then added to the remaining suspension to dissolve the whole crystals and part of the solution is taken out and examined for optical purity, and by comparing the optical purity obtained in the step (a) with that obtained in the step (b). Suplatast tosilate crystals excellent in evenness and thermal stability are provided.

Inventors:

USHIO TAKANORI (JP)
NAGAI KEIKO (JP)

Application Number:

PCT/JP2005/012893

Publication Date:

January 19, 2006

Filing Date:

July 13, 2005

Export Citation:

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Assignee:

TAIHO PHARMACEUTICAL CO LTD (JP)
USHIO TAKANORI (JP)
NAGAI KEIKO (JP)

International Classes:

A61K31/167; C07C381/12; A61P37/08; G01N21/21; G01N23/20

Domestic Patent References:

WO2002083633A1

2002-10-24

Foreign References:

JPS59167564A	1984-09-21
JPH07252213A	1995-10-03

Other References: