Title:
METHOD FOR EVALUATING EXTERIOR STATE AND VALUE OF ELECTRONIC DEVICE, AND APPARATUS FOR EVALUATING VALUE OF ELECTRONIC DEVICE
Document Type and Number:
WIPO Patent Application WO/2023/191312
Kind Code:
A1
Abstract:
A method for evaluating the exterior state and the value of an electronic device is disclosed. In one embodiment, whether an exception case is present in a plurality of images obtained by photographing an electronic device is determined, the exterior state of the electronic device is evaluated using deep learning evaluation models and the images if it is determined that the exception case is not present in the images, whether the exception case can be processed is determined if it is determined that there is a target image in which the exception case is present in the images, the exception case in the target image is processed if it is determined that the exception case can be processed, and the exterior state can be evaluated using the remaining images that excludes the target image from the images, the target image in which the exception case is processed, and the deep learning evaluation models.
Inventors:
JI CHANG HWAN (KR)
YOO DO HYUNG (KR)
YOO DO HYUNG (KR)
Application Number:
PCT/KR2023/002425
Publication Date:
October 05, 2023
Filing Date:
February 21, 2023
Export Citation:
Assignee:
MINTIT CO LTD (KR)
International Classes:
G01N21/88; G06N3/08; G06Q30/02; G06T7/00
Foreign References:
| KR20210127199A | 2021-10-21 | |||
| US20210192484A1 | 2021-06-24 | |||
| KR20190107594A | 2019-09-20 | |||
| KR20190116876A | 2019-10-15 | |||
| KR20200115308A | 2020-10-07 |
Attorney, Agent or Firm:
MUHANN PATENT & LAW FIRM (KR)
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