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Patent Searching and Data


Title:
METHOD AND INSTRUMENT FOR MEASURING FLAW HEIGHT IN ULTRASONIC TESTING
Document Type and Number:
WIPO Patent Application WO/2007/004303
Kind Code:
A1
Abstract:
Measurement of the flaw height of a thick stainless steel welded portion difficult to apply the TOFD method is performed conveniently and precisely in a short time by a tip-echo technique while suppressing variations with inspectors. An ultrasonic wave (21) is emitted from a transmission probe (1) to a flaw (24) in an object under inspection (20) from an oblique direction and a diffracted wave is generated at the end (25) of the flaw (24). A diffracted wave (22) propagating directly above the flaw (24) and a diffracted wave (23) propagating above the flaw after reflecting from the rear surface (27) are received by a receiving probe (2) above the flaw (24). The height position from the rear surface (27) at the end of the flaw (24) is measured from the difference between the propagation times.

Inventors:
FUKUTOMI HIROYUKI (JP)
LIN SHAN (JP)
OGATA TAKASHI (JP)
Application Number:
PCT/JP2005/012497
Publication Date:
January 11, 2007
Filing Date:
July 06, 2005
Export Citation:
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Assignee:
CENTRAL RES INST ELECT (JP)
FUKUTOMI HIROYUKI (JP)
LIN SHAN (JP)
OGATA TAKASHI (JP)
International Classes:
G01N29/04
Foreign References:
JP2005070011A2005-03-17
JP2004257971A2004-09-16
JP2004020549A2004-01-22
JPH0212609Y21990-04-09
JP3076864B22000-08-14
JPH0278949A1990-03-19
JPS6191568A1986-05-09
Attorney, Agent or Firm:
MURASE, Kazumi (12-7 Nishishimbashi 2-chome, Minato-k, Tokyo 03, JP)
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