METHOD FOR PREPARING SAMPLE FOR ANALYSIS

WIPO Patent Application WO/2019/163394

A1

Provided is a novel method for preparing a sample for analysis which enables convenient analysis without limiting the element contained in the sample to boron and/or phosphorus. This method for preparing a sample for analysis is for analyzing an element contained in the sample, and includes a specific incineration step, a specific acid dissolving step, and a specific cation exchange resin contacting step.

JPS58162043	PREPARATION FOR THIN SAMPLE TO BE OBSERVED BY ELECTRON MICROSCOPE
JP2005156497	DISTRIBUTION CONDITION ANALYSIS METHOD USING ELECTRON MICROSCOPE FOR MATERIAL INSIDE CAPSULE

SUEKANE TAKASHI (JP)
TSUCHIYA HIROSHI (JP)
KANEKO NAO (JP)

PCT/JP2019/002368

August 29, 2019

January 24, 2019

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SUMIKA CHEMICAL ANALYSIS SERVICE LTD (JP)

G01N1/28; G01N1/44

JP2008203122A

2008-09-04

MURAKI, ISAO: "On the determination of a small amount of boron", JAPAN ANALYST, vol. 6, 1957, pages 319 - 327
KRAMER, H.: "Determination of boron in silicates after ion exchange separation", ANALYTICAL CHEMISTRY, vol. 27, no. 1, 18 January 1955 (1955-01-18), pages 144 - 145, XP055632858
MARTIN, J. R. ET AL.: "Application of ion exchange to determination of boron", ANALYTICAL CHEMISTRY, vol. 24, no. 1, January 1952 (1952-01-01), pages 182 - 185, XP055632863

HARAKENZO WORLD PATENT & TRADEMARK (JP)

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