Title:
METHOD FOR QUANTITATIVELY ANALYZING TARGET MATERIAL AND DEVICE FOR QUANTITATIVELY ANALYZING TARGET MATERIAL BY USING SAME
Document Type and Number:
WIPO Patent Application WO/2019/017501
Kind Code:
A1
Abstract:
The present invention provides a method for optically and quantitatively analyzing a target material and a device for quantitatively analyzing a target material by using the same, the method comprising the steps of: emitting light on a biochip comprising a plurality of target materials which does not include a fluorescent indicator material; acquiring, by using an image sensor, a plurality of low-resolution images of a region including the plurality of target materials; acquiring a high-resolution image on the basis of the plurality of images; and counting the plurality of target materials in the high-resolution image.
Inventors:
CHOI JUN KYU (KR)
KANG GYEONG WOO (KR)
KANG GYEONG WOO (KR)
Application Number:
PCT/KR2017/007651
Publication Date:
January 24, 2019
Filing Date:
July 17, 2017
Export Citation:
Assignee:
SMALL MACHINES (KR)
International Classes:
G01N21/17
Foreign References:
| KR20130111185A | 2013-10-10 | |||
| KR20080091955A | 2008-10-15 | |||
| KR20140098285A | 2014-08-08 | |||
| KR20120088349A | 2012-08-08 | |||
| JP2015506710A | 2015-03-05 |
Attorney, Agent or Firm:
INVENTUS INTELLECTUAL PROPERTY GROUP (KR)
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