Title:
METHOD AND SYSTEM FOR CONTROLLING INSTRUMENT STATE ON ASSEMBLY LINE AND ANALYSIS DEVICE
Document Type and Number:
WIPO Patent Application WO/2020/037544
Kind Code:
A1
Abstract:
A method and system for controlling an instrument state on an assembly line and an analysis device, the method comprising: determining whether an analysis device (10) in an off-line state in an assembly line meets a preset restoration condition, the preset restoration condition comprising that the analysis device (10) fails to receive a user operation instruction within a preset duration after completing a preset task; and if the analysis device (10) meets a preset restoration condition, restoring the analysis device (10) to an on-line state. By means of setting a preset restoration condition, the analysis device (10) is automatically restored from an off-line state to an on-line state, thereby improving the working efficiency of the analysis device (10) and improving the working efficiency of an assembly line system.
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Inventors:
LI SHENGPING (CN)
JIANG JIE (CN)
WEI RUIRUI (CN)
JIANG JIE (CN)
WEI RUIRUI (CN)
Application Number:
PCT/CN2018/101724
Publication Date:
February 27, 2020
Filing Date:
August 22, 2018
Export Citation:
Assignee:
SHENZHEN MINDRAY BIOMEDICAL ELECTRONICS CO LTD (CN)
SHENZHEN MINDRAY SCIENT CO LTD (CN)
SHENZHEN MINDRAY SCIENT CO LTD (CN)
International Classes:
G01N35/04; G06F9/00
Foreign References:
| CN106971075A | 2017-07-21 | |||
| EP0856736A2 | 1998-08-05 | |||
| CN101639418A | 2010-02-03 | |||
| CN104053997A | 2014-09-17 | |||
| CN108027381A | 2018-05-11 |
Attorney, Agent or Firm:
DHC IP ATTORNEYS (CN)
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