Title:
METHOD AND SYSTEM FOR DETERMINING DEFECT AGGREGATION IN IMAGE OVERLAY
Document Type and Number:
WIPO Patent Application WO/2020/077784
Kind Code:
A1
Abstract:
A method and a system (30) for determining defect aggregation in an image overlay. The method comprises: automatically screening for defect groups in a defect-image overlay; and determining whether the defect-image overlay contains a defect group in which the number of defects is greater than a first preset value, so as to determine whether defect aggregation is present in the defect-image overlay. When compared with manually observing the phenomenon of defect aggregation in a defect-image overlay, the present application provides a faster and more accurate method for detecting said phenomenon.
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Inventors:
GAO SONG (CN)
Application Number:
PCT/CN2018/120979
Publication Date:
April 23, 2020
Filing Date:
December 13, 2018
Export Citation:
Assignee:
SHENZHEN CHINA STAR OPTOELECTRONICS SEMICONDUCTOR DISPLAY TECH CO LTD (CN)
International Classes:
G06K9/62
Foreign References:
| CN106067427A | 2016-11-02 | |||
| CN107941812A | 2018-04-20 | |||
| CN105205803A | 2015-12-30 | |||
| CN103064206A | 2013-04-24 | |||
| JP2013164371A | 2013-08-22 | |||
| CN101484910A | 2009-07-15 |
Attorney, Agent or Firm:
ESSEN PATENT&TRADEMARK AGENCY (CN)
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