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Patent Searching and Data


Title:
METHOD AND SYSTEM FOR TESTING CONVERSION RELATIONSHIP BETWEEN BLOCK READING AND PAGE READING IN FLASH MEMORY CHIP
Document Type and Number:
WIPO Patent Application WO/2022/037168
Kind Code:
A1
Abstract:
A method and system for testing a conversion relationship between block reading and page reading in a flash memory chip. A test point is selected, block readings are respectively performed, and a bit error rate file is recorded; a test starting point, a test ending point, and a test step length are set in a block, bit error rate file recording of number of corresponding page readings is separately performed, and number of page readings when a proportion of page error codes is closest to a proportion of block error codes is found from proportions of page error codes, such that conversion of number of block readings and number of page readings is completed. Conversion coefficients of the block reading and the page reading can be calculated for a block in different states of a life cycle, and a certain block and number of block readings can be more accurately recorded in firmware. Thus, when a threshold value is reached, data in the block can be moved, and the efficiency is improved.

Inventors:
LI DONG (CN)
Application Number:
PCT/CN2021/096251
Publication Date:
February 24, 2022
Filing Date:
May 27, 2021
Export Citation:
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Assignee:
INSPUR SUZHOU INTELLIGENT TECHNOLOGY CO LTD (CN)
International Classes:
G06F11/22; G06F11/10
Foreign References:
CN112069004A2020-12-11
CN111324283A2020-06-23
CN106776095A2017-05-31
US20200192735A12020-06-18
US20160342344A12016-11-24
US20190171381A12019-06-06
Attorney, Agent or Firm:
UNITALEN ATTORNEYS AT LAW (CN)
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