Title:
METHOD FOR TESTING RADIO WAVE REFLECTING DEVICE
Document Type and Number:
WIPO Patent Application WO/2024/029170
Kind Code:
A1
Abstract:
According to this method for testing a radio wave reflecting device, which has a plurality of reflection elements arranged in a row direction and in a column direction, the plurality of reflection elements each has: a patch electrode; a common electrode lying on the side of the back surface of the patch electrode; and a liquid crystal layer located between the patch electrode and the common electrode. A voltage V1 is applied between each of the plurality of patch electrodes and the common electrode, thereby determining whether the reflection elements are good or bad on the basis of the change of a frame-shaped area appearing around the plurality of patch electrodes seen in a plan view when the voltage is applied between the plurality of patch electrodes and the common electrode.
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Inventors:
SUZUKI DAIICHI (JP)
OKA SHINICHIRO (JP)
OKITA MITSUTAKA (JP)
OKA SHINICHIRO (JP)
OKITA MITSUTAKA (JP)
Application Number:
PCT/JP2023/019428
Publication Date:
February 08, 2024
Filing Date:
May 25, 2023
Export Citation:
Assignee:
JAPAN DISPLAY INC (JP)
International Classes:
H01Q3/36; H01P1/18; H01Q15/14
Domestic Patent References:
| WO2020189451A1 | 2020-09-24 |
Foreign References:
| JP2021517745A | 2021-07-26 | |||
| CN207474683U | 2018-06-08 | |||
| JPH055709A | 1993-01-14 | |||
| JP2003194669A | 2003-07-09 | |||
| CN111077700A | 2020-04-28 |
Attorney, Agent or Firm:
TAKAHASHI, HAYASHI AND PARTNER PATENT ATTORNEYS, INC. (JP)
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