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Title:
METHOD FOR TESTING SAMPLING CHIP, TEST APPARATUS, CONTROL DEVICE, AND STORAGE MEDIUM
Document Type and Number:
WIPO Patent Application WO/2024/077614
Kind Code:
A1
Abstract:
The present application provides a method for testing a sampling chip, a test apparatus, a control device, a computer readable storage medium, and a computer program product. The method for testing a sampling chip comprises: according to a working mode of a battery cell coupled to a sampling chip, configuring a coupling mode of a high-voltage source across the sampling chip, wherein the sampling chip is used for collecting information of the battery cell, and the high-voltage source is used for providing a voltage across the sampling chip when simulating an open circuit of the battery cell; simulating the open circuit of the battery cell by means of a switching circuit according to the coupling mode of the high-voltage source; and determining a working state of the sampling chip in the open-circuit period of the battery cell.

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Inventors:
ZHOU FANGJIE (CN)
CHU LE (CN)
WU GUOXIU (CN)
Application Number:
PCT/CN2022/125483
Publication Date:
April 18, 2024
Filing Date:
October 14, 2022
Export Citation:
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Assignee:
CONTEMPORARY AMPEREX TECHNOLOGY CO LTD (CN)
International Classes:
G01R31/36
Foreign References:
CN206321427U2017-07-11
CN110221234A2019-09-10
CN110763983A2020-02-07
CN217639331U2022-10-21
DE102018105881B32019-06-27
US20170045570A12017-02-16
Attorney, Agent or Firm:
BEIJING HAN KUN LAW OFFICES (CN)
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