Title:
METHOD TO OPTIMIZE TEST DATA
Document Type and Number:
WIPO Patent Application WO2003034167
Kind Code:
A3
Abstract:
A method for optimizing data gathering, is provided wherein the method comprising the steps of designing a first system test comprising two or more maneuvers, compiling a one or more data variable for each of the two or more maneuvers from the first system test, pooling each data variable from each maneuvers into a first set of data, removing a first maneuver's data variables from the pooled first set of data, comparing the first maneuver's data variables against the first set of data with the first maneuver's data variables removed, and determining whether to perform the first maneuver based on whether the maneuver provided new data.
Inventors:
VANDERWIEL ROBERT W
Application Number:
PCT/US2002/033084
Publication Date:
February 26, 2004
Filing Date:
October 15, 2002
Export Citation:
Assignee:
LOCKHEED CORP (US)
International Classes:
B64F5/00; G05B23/02; (IPC1-7): G05B23/02; B64F5/00
Foreign References:
| EP0892248A2 | 1999-01-20 | |||
| US5270642A | 1993-12-14 | |||
| US5742513A | 1998-04-21 |
Download PDF: