Title:
METHODS AND SYSTEMS FOR ESTIMATING DAMAGE RISK DUE TO DROP OF AN ELECTRONIC DEVICE
Document Type and Number:
WIPO Patent Application WO/2023/008727
Kind Code:
A1
Abstract:
Embodiments disclosed herein relate to electronic devices, and more particularly to estimating a damage risk level for an electronic device. A method disclosed herein includes measuring motion parameters of the electronic device, on the electronic device being dropped on a surface. The method further includes classifying the surface into at least one type by processing the measured motion parameters using a classifier module. The method further includes estimating a damage risk score depicting the damage risk level for the electronic device based on the classified surface, the measured motion parameters of the electronic device, and a usage history of the electronic device.
Inventors:
GOEL PRASH (IN)
AGGARWAL KUNAL (IN)
GUPTA GAURAV (IN)
MONDAL ARINDAM (IN)
MATHUR ANIROOP (IN)
TEKRIWAL ARCHIT (IN)
AGGARWAL KUNAL (IN)
GUPTA GAURAV (IN)
MONDAL ARINDAM (IN)
MATHUR ANIROOP (IN)
TEKRIWAL ARCHIT (IN)
Application Number:
PCT/KR2022/008002
Publication Date:
February 02, 2023
Filing Date:
June 07, 2022
Export Citation:
Assignee:
SAMSUNG ELECTRONICS CO LTD (KR)
International Classes:
H04M1/72454; G01P15/08
Foreign References:
| CN108769350B | 2021-03-12 | |||
| CN108197007B | 2021-06-29 | |||
| JP2010038839A | 2010-02-18 | |||
| US9780621B2 | 2017-10-03 | |||
| KR20200101868A | 2020-08-28 |
Attorney, Agent or Firm:
KIM, Tae-hun et al. (KR)
Download PDF:
Previous Patent: LIGHT EMITTING ELEMENT PACKAGE MANUFACTURING METHOD, DISPLAY APPARATUS, AND DISPLAY APPARATUS MANUFA...
Next Patent: PHOTOIONIZER
Next Patent: PHOTOIONIZER