Title:
METHODS AND SYSTEMS FOR IMPROVED QUALITY INSPECTION
Document Type and Number:
WIPO Patent Application WO/2019/001098
Kind Code:
A1
Abstract:
A method of identifying product defects on a production line includes receiving data from a plurality of edge devices monitoring a product on a production line for product defects. The data includes unique perspectives of the product captured by the edge devices. The method further includes generating an overall view of the product by merging each unique perspective of the product captured by respective edge devices of the plurality, and comparing the overall view with characteristic (s) of the product. Based on the comparing, the method further includes determining whether a degree of difference between the overall view and the characteristic (s) satisfies one or more criteria, and upon determining that the degree of difference between the overall view and the characteristic (s) satisfies at least one criterion of the one or more criteria, recording and reporting a defect associated with the product according to the difference between the view and the characteristic (s).
Inventors:
WANG DONGYAN (US)
GU HAISONG (US)
GU HAISONG (US)
Application Number:
PCT/CN2018/083352
Publication Date:
January 03, 2019
Filing Date:
April 17, 2018
Export Citation:
Assignee:
MIDEA GROUP CO LTD (CN)
International Classes:
G01N21/892
Domestic Patent References:
| WO2017001968A1 | 2017-01-05 | |||
| WO2017031710A1 | 2017-03-02 |
Foreign References:
| CN102183528A | 2011-09-14 | |||
| CN103286081A | 2013-09-11 | |||
| CN102680495A | 2012-09-19 |
Attorney, Agent or Firm:
CHINA PAT INTELLECTUAL PROPERTY OFFICE (CN)
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