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Patent Searching and Data


Title:
MICROORGANISM TEST METHOD
Document Type and Number:
WIPO Patent Application WO/2015/170362
Kind Code:
A1
Abstract:
[Problem] To enable the simple and rapid detection of a dominant microorganism species in the test on the presence or absence of microorganisms in an environment. [Solution] A microorganism test method comprising the steps of: collecting a sample from an environment and culturing microorganisms contained in the sample in a culture medium; when at least two colonies are formed by the culturing of the microorganisms, dividing the formed colonies into at least two masses and extracting nucleic acid of a microorganism contained in each of the masses; amplifying a nucleic acid fragment containing a domain of interest using the extracted nucleic acid; detecting microorganisms contained in each of the masses using the amplified nucleic acid fragment; and, when at least two microorganisms are detected in the aforementioned microorganism detection step, calculating the ratio of the number of masses in which the microorganisms are detected to the total number of masses, which is at least two, to determine a dominant microorganism species in the environment.

Inventors:
ISSHIKI ATSUNORI (JP)
KOKAJI MAMI (JP)
TANABE SUGURU (JP)
YOSHIDA MITSUHIRO (JP)
Application Number:
PCT/JP2014/002422
Publication Date:
November 12, 2015
Filing Date:
May 07, 2014
Export Citation:
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Assignee:
TOYO SEIKAN GROUP HOLDINGS LTD (JP)
International Classes:
C12N15/09; C12Q1/04; C12Q1/68
Foreign References:
JP2012200213A2012-10-22
Other References:
MITSUHIRO YOSHIDA: "DNA Inspection Device for Fungi with DNA Chip", FOOD PROCESSING AND INGREDIENTS, vol. 47, no. 1, 2012, pages 38 - 40
EARTH KANKYO SERVICE KABUSHIKI KAISHA ET AL.: "Tanjikan·Tei-cost·Koseido de Biseibutsu Osen Jokyo o Ikkatsu Kensa", GEKKAN HACCP, vol. 19, no. 5, 2013, pages 40 - 43
EARTH KANKYO SERVICE KABUSHIKI KAISHA ET AL.: "Tanjikan·Tei-cost·Koseido de Biseibutsu Osen Jokyo o Ikkatsu Kensa", KEIRAN NIKU JOHO, vol. 43, no. 9, 2013, pages 78 - 81
Attorney, Agent or Firm:
WATANABE, Kihei et al. (JP)
Kihei Watanabe (JP)
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