MICROPARTICLE MEASUREMENT DEVICE, INFORMATION PROCESSING DEVICE, AND INFORMATION PROCESSING METHOD

Title:

MICROPARTICLE MEASUREMENT DEVICE, INFORMATION PROCESSING DEVICE, AND INFORMATION PROCESSING METHOD

Document Type and Number:

WIPO Patent Application WO/2017/126170

Kind Code:

A1

Abstract:

Provided is a technology for correcting output level differences with a high degree of accuracy in microparticle measurement for optically measuring the characteristics of microparticles. The present invention provides, for example, a microparticle measurement device that is provided with a detection unit for detecting light from fluorescent reference particles that emit fluorescence of a prescribed wavelength band and an information processing unit for, on the basis of output pulse feature values that are detected by the detection unit and a control signal for the detection unit when the output pulse feature values were detected, specifying the relationship between an applied voltage coefficient corresponding to a prescribed output pulse feature value and the control signal for the detection unit, wherein the output pulse feature values are dependent on the control signal for the detection unit.

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Inventors:

TAHARA KATSUTOSHI (JP)

Application Number:

PCT/JP2016/080653

Publication Date:

July 27, 2017

Filing Date:

October 17, 2016

Export Citation:

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Assignee:

SONY CORP (JP)

International Classes:

G01N15/14; C12M1/34; C12Q1/00; C12Q1/02; G01N21/64

Foreign References:

JP2004205508A	2004-07-22
JP2007508526A	2007-04-05
JP2011085587A	2011-04-28
JPH10311789A	1998-11-24
JP2015025824A	2015-02-05
JP2003083894A	2003-03-19

Other References: