Title:
MICROPARTICLE MEASUREMENT METHOD, MICROPARTICLE MEASUREMENT DEVICE, AND MICROPARTICLE MEASUREMENT SYSTEM
Document Type and Number:
WIPO Patent Application WO/2023/095414
Kind Code:
A1
Abstract:
An embodiment of this microparticle measurement method is executed by a microparticle measurement device comprising: a light source that emits illumination light onto a liquid which contains microparticles to be measured; an objective lens that condenses the illumination light; an image-forming lens that forms an image using the condensed illumination light; and a sensor that detects the illumination light which was formed into an image. The method comprises: a step for measuring the distance to the objective lens from a position where the transmitting light intensity of the microparticles to be measured is at a maximum level; and a step for calculating a refractive index of the microparticles to be measured, on the basis of the particle diameter of the microparticles and the measured distance.
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Inventors:
HASHIMOTO YUTA (JP)
MIZUUCHI RIEKO (JP)
TORII MORIAKI (JP)
HU JINYANG (JP)
HAYAMI TOKUSUKE (JP)
NODA SHUHEI (JP)
KAKINUMA KENJI (JP)
MIZUUCHI RIEKO (JP)
TORII MORIAKI (JP)
HU JINYANG (JP)
HAYAMI TOKUSUKE (JP)
NODA SHUHEI (JP)
KAKINUMA KENJI (JP)
Application Number:
PCT/JP2022/033496
Publication Date:
June 01, 2023
Filing Date:
September 07, 2022
Export Citation:
Assignee:
TOSHIBA KK (JP)
TOSHIBA INFRASTRUCTURE SYSTEMS & SOLUTIONS CORP (JP)
TOSHIBA INFRASTRUCTURE SYSTEMS & SOLUTIONS CORP (JP)
International Classes:
G01N15/00; G01N15/02; G01N15/06; G01N21/59
Foreign References:
| JP2021135129A | 2021-09-13 | |||
| JP2021505986A | 2021-02-18 | |||
| JP2016038360A | 2016-03-22 | |||
| JP2010133928A | 2010-06-17 | |||
| CN203930218U | 2014-11-05 |
Attorney, Agent or Firm:
SAKAI INTERNATIONAL PATENT OFFICE (JP)
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