Title:
MICROSCOPE INSPECTION DEVICE AND NAVIGATION METHOD
Document Type and Number:
WIPO Patent Application WO/2021/117244
Kind Code:
A1
Abstract:
A microscope inspection device (1) is provided with: an imaging unit (2) that acquires an image of the observation region to be inspected; a positioning unit (7) that positions the image of the observation region on a region corresponding to the image of the observation region in a reference image, the reference image including the entire region to be inspected; a navigation map generation unit (8) that generates a navigation map from the reference image by recording the position of the region where the image of the observation region is positioned in the reference image; an access calculation unit (9) that calculates a moving direction to an unobserved region in the reference image on the basis of the navigation map; and a navigation presentation unit (10) that presents a method for accessing the unobserved region on the basis of the moving direction.
More Like This:
| WO/1990/005295 | OPTICAL BIOSENSOR SYSTEM |
| WO/2003/023484 | FREE-FLOATING CRYOSTAT SECTIONS FOR IMMUNOELECTRON MICROSCOPY |
| WO/1998/018036 | MICROSCOPE WITH A PROXIMITY SENSOR |
Inventors:
ABE YOKO (JP)
Application Number:
PCT/JP2019/049050
Publication Date:
June 17, 2021
Filing Date:
December 13, 2019
Export Citation:
Assignee:
OLYMPUS CORP (JP)
International Classes:
G02B21/00; G02B7/28; G02B21/26; G02B21/36
Foreign References:
| JP2019191306A | 2019-10-31 | |||
| JP2005530225A | 2005-10-06 | |||
| JP2010134374A | 2010-06-17 | |||
| JP2015082099A | 2015-04-27 |
Attorney, Agent or Firm:
UEDA, Kunio et al. (JP)
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