Title:
MOBILE DEVICE, EXPOSURE DEVICE, EXPOSURE METHOD, MICRO-MOTION BODY, AND DEVICE MANUFACTURING METHOD
Document Type and Number:
WIPO Patent Application WO/2007/113955
Kind Code:
A1
Abstract:
Since power transmission/waste heat frames (24A, 24B) can always absorb heat
radiated from wafer stages (WST1, WST2), it is possible to suppress affect of
heat generated in the wafer stages (WST1, WST2) to an exposure accuracy. In this
case, there is no need of connecting an external tube for supplying a coolant to
the wafer stages (WST1, WST2) as in the prior art. Accordingly, it is possible
to prevent lowering of the motion accuracy of the wafer stages (WST1, WST2) by
the tension of the tube, which in turn maintains a high exposure accuracy.
Inventors:
TANAKA KEIICHI (JP)
Application Number:
PCT/JP2007/053723
Publication Date:
October 11, 2007
Filing Date:
February 28, 2007
Export Citation:
Assignee:
NIKON CORP (JP)
TANAKA KEIICHI (JP)
TANAKA KEIICHI (JP)
International Classes:
H01L21/027; H01L21/68
Domestic Patent References:
WO2004053955A1 | 2004-06-24 | |||
WO2005074014A1 | 2005-08-11 | |||
WO2001035168A1 | 2001-05-17 |
Foreign References:
JP2003058258A | 2003-02-28 | |||
JP2005209997A | 2005-08-04 | |||
JPH07270122A | 1995-10-20 | |||
JP2005277030A | 2005-10-06 | |||
JP2003229347A | 2003-08-15 | |||
JPH11214482A | 1999-08-06 | |||
JP2004311780A | 2004-11-04 | |||
JP2003068626A | 2003-03-07 | |||
JPH06283403A | 1994-10-07 | |||
US5448332A | 1995-09-05 | |||
JPH0559660B2 | 1993-08-31 | |||
JPS58115945A | 1983-07-09 | |||
JPS6144429A | 1986-03-04 | |||
US6778257B2 | 2004-08-17 | |||
JP2004519850A | 2004-07-02 | |||
US6611316B2 | 2003-08-26 |
Other References:
See also references of EP 2006884A4
Attorney, Agent or Firm:
TATEISHI, Atsuji (Karakida Center Bldg.1-53-9, Karakida,Tama-sh, Tokyo 35, JP)
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