MODEL ANALYSIS DEVICE, MODEL ANALYSIS METHOD, AND RECORDING MEDIUM

Title:

MODEL ANALYSIS DEVICE, MODEL ANALYSIS METHOD, AND RECORDING MEDIUM

Document Type and Number:

WIPO Patent Application WO/2023/181244

Kind Code:

A1

Abstract:

A model analysis device, wherein a model acquisition means acquires a model. A performance calculation means calculates the performance of the model for each attribute included in a data category. An output means extracts an attribute pair for which the difference in model performance satisfies a prescribed condition, and outputs performance information indicating model performance for each attribute included in the pair.

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Inventors:

MATSUNO RYUTA (JP)
SAKAI TOMOYA (JP)
SAKUMA KEITA (JP)
KAMEDA YOSHIO (JP)

Application Number:

PCT/JP2022/013900

Publication Date:

September 28, 2023

Filing Date:

March 24, 2022

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Assignee:

NEC CORP (JP)

International Classes:

G06N20/00

Foreign References:

US20200349466A1

2020-11-05

Other References:

BARCELOS GABE: "Understanding Bias in Machine Learning Models", ARIZE, 15 March 2022 (2022-03-15), XP093094779, Retrieved from the Internet [retrieved on 20231025]

Attorney, Agent or Firm:

NAKAMURA, Toshinobu et al. (JP)

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