Title:
MOTION ANALYSIS SYSTEM AND MOTION ANALYSIS METHOD
Document Type and Number:
WIPO Patent Application WO/2014/097579
Kind Code:
A1
Abstract:
A motion analysis system includes an analysis control device that receives measurement data of physical quantities based on a motion of a measurement subject from a plurality of measuring units, calculates, for each of the measuring units, a first calculation value based on the physical quantities, determines, as timing of an impact in the motion, time when a value based on the first calculation value satisfies a predetermined condition, synchronizes, on the basis of the timing of the impact, the measurement data generated by the plurality of measuring units, and analyzes the motion of the measurement subject.
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Inventors:
SHIBUYA KAZUHIRO (JP)
Application Number:
PCT/JP2013/007282
Publication Date:
June 26, 2014
Filing Date:
December 11, 2013
Export Citation:
Assignee:
SEIKO EPSON CORP (JP)
International Classes:
A63B69/36
Foreign References:
| US20120157241A1 | 2012-06-21 | |||
| JP2009050721A | 2009-03-12 |
Attorney, Agent or Firm:
KAMIYANAGI, Masataka et al. (80 Harashinden, Hirooka, Shiojiri-sh, Nagano 85, JP)
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