Title:
MULTI-COMPONENT-BASED ELECTRIC FIELD PROBE AND MAGNETIC FIELD PROBE CALIBRATION SYSTEM AND METHOD
Document Type and Number:
WIPO Patent Application WO/2021/196687
Kind Code:
A1
Abstract:
A multi-component-based electric field probe and magnetic field probe calibration system and method. Said calibration system comprises a microstrip line calibration assembly, a clamp, a vector network analyzer and a data processing unit; two groups of microstrip lines contained in the microstrip line calibration assembly can be distributed on different wiring layers of the same PCB, and can also be distributed on an independent PCB; a first group of microstrip lines consists of single microstrip lines or differential lines under common-mode excitation, and is used for generating a main component Hy of a magnetic field, and the second group of microstrip lines consists of differential lines under differential-mode excitation, and is used for generating a main component Ex of an electric field. Said calibration system uses two groups of microstrip lines to respectively generate a horizontal magnetic field component and a horizontal electric field component to measure the coupling degree of an electromagnetic field probe to an external electric field and magnetic field; furthermore, a calculation formula of a calibration factor is proposed, so that the limitation that only the coupling degree of a probe to a field to be measured can be measured by using a single magnetic field component or a single electric field component currently is overcome, and the coupling degree of the electric field probe to a magnetic field not to be measured and the coupling degree of the magnetic field probe to an electric field not to be measured can be fully measured.
Inventors:
WEI XINGCHANG (CN)
ZHANG LI (CN)
ZHANG LI (CN)
Application Number:
PCT/CN2020/133072
Publication Date:
October 07, 2021
Filing Date:
December 01, 2020
Export Citation:
Assignee:
UNIV ZHEJIANG (CN)
International Classes:
G01R35/00
Foreign References:
| CN111398882A | 2020-07-10 | |||
| CN105425014A | 2016-03-23 | |||
| CN106990277A | 2017-07-28 | |||
| JPH07191122A | 1995-07-28 | |||
| CN106053965A | 2016-10-26 | |||
| CN108152575A | 2018-06-12 | |||
| CN104569888A | 2015-04-29 | |||
| CN102401888A | 2012-04-04 | |||
| CN101839949A | 2010-09-22 |
Other References:
ATANASKOVIC ALEKSANDAR; DIMITRIJEVIC TIJANA; DONCOV NEBOJSA; JOKOVIC JUGOSLAV; MILOVANOVIC BRATISLAV: "Study of Loop Probe Dimensions Influence on a Probe Calibration Factor in Near-Field Measurements", 2019 14TH INTERNATIONAL CONFERENCE ON ADVANCED TECHNOLOGIES, SYSTEMS AND SERVICES IN TELECOMMUNICATIONS (TELSIKS), 23 October 2019 (2019-10-23), pages 335 - 338, XP033718527
Attorney, Agent or Firm:
HANGZHOU QIUSHI PATENT OFFICE CO., LTD. (CN)
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