Title:
MULTIFUNCTIONAL DEBUGGING TOOL
Document Type and Number:
WIPO Patent Application WO/2023/020099
Kind Code:
A1
Abstract:
A multifunctional debugging tool, comprising: a housing (100) having one end provided with a mounting hole (101); a first magnetic member (210) provided inside the housing (100) below the mounting hole (101); a second magnetic member (220) provided inside the other end of the housing (100); and a group of needles (300) attracted to the periphery of the other end of the housing (100) by means of the second magnetic member (220). Needles having different functions are integrated into one tool by means of a group of magnets, and different debugging purposes can be achieved by replacing the needles having different functions, thereby implementing low price cost, quick operations, and good reproducibility.
More Like This:
| JP2003525132 | [Title of Invention] Insulating composite breaker bar |
| JP5183843 | Tool set and dismantling tools |
Inventors:
ZHU WEI (CN)
LONG HUA (CN)
LONG HUA (CN)
Application Number:
PCT/CN2022/099453
Publication Date:
February 23, 2023
Filing Date:
June 17, 2022
Export Citation:
Assignee:
LANSUS TECH INC (CN)
International Classes:
B25F1/02; B25B23/16; B23K3/08; B25B23/12
Foreign References:
| CN216126668U | 2022-03-25 | |||
| CN206732849U | 2017-12-12 | |||
| CN207643024U | 2018-07-24 | |||
| DE102006047241A1 | 2008-04-10 | |||
| TWM581032U | 2019-07-21 | |||
| CN209755110U | 2019-12-10 |
Attorney, Agent or Firm:
SHENZHEN JUNXINCHENG INTELLECTUAL PROPERTY FIRM (GENERAL PARTNERSHIP) (CN)
Download PDF:
Previous Patent: HARMONIC SUPPRESSION MATCHING CIRCUIT STRUCTURE SUITABLE FOR BALUN, AND POWER AMPLIFIER
Next Patent: CHIP TEST SYSTEM
Next Patent: CHIP TEST SYSTEM