MULTILAYER POSITIVE-CHARACTERISTIC THERMISTOR AND ITS DESIGNING METHOD

Title:

MULTILAYER POSITIVE-CHARACTERISTIC THERMISTOR AND ITS DESIGNING METHOD

Document Type and Number:

WIPO Patent Application WO/2005/043555

Kind Code:

A1

Abstract:

A multilayer positive-characteristic thermistor having a low resistance reliably achieved by reducing the thickness of a ceramic layer of a BaTiO₃ semiconductor ceramic. The resistance value can be approximate to that calculated from the multilayer structure. The thermistor satisfies the following relations. 5≤X≤18 and 4≤X·Y≤10 where X [μm] is the thickness of each ceramic layer (2) between inner electrodes (3) and Y [%] is the amount of donors contained in the BaTiO₃ semiconductor ceramic constituting the ceramic layers (2) and is represented by (number of atoms of the donors/number of Ti atoms)×100.

Inventors:

NIIMI HIDEAKI (JP)
ANDO AKIRA (JP)

Application Number:

PCT/JP2004/013316

Publication Date:

May 12, 2005

Filing Date:

September 13, 2004

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Assignee:

MURATA MANUFACTURING CO (JP)
NIIMI HIDEAKI (JP)
ANDO AKIRA (JP)

International Classes:

H01C7/02; H01C7/18; H01G4/12; H01G7/06; (IPC1-7): H01C7/02

Foreign References:

JP2000256062A	2000-09-19
JP2002043103A	2002-02-08
JP2004063548A	2004-02-26

Attorney, Agent or Firm:

Koshiba, Masaaki (Nisshin Buiding 14-22, Shitennoji 1-chome, Tennoji-ku, Osaka-sh, Osaka 51, JP)

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