Title:
MYELODYSPLASTIC SYNDROME TEST KIT
Document Type and Number:
WIPO Patent Application WO/2024/048608
Kind Code:
A1
Abstract:
In the present invention, an SF3B1 gene mutation associated with MDS prognosis prediction is detected at high accuracy. A blocking nucleic acid that contains a base sequence complementary to a non-target nucleic acid containing a plurality of bases not to be detected that correspond to bases to be detected at a plurality of mutation locations associated with MDS in the SF3B1 gene is used.
Inventors:
MORIHIRO JUNICHI (JP)
TAKAMITSU EMI (JP)
YUJIRI TOSHIAKI (JP)
TAKAMITSU EMI (JP)
YUJIRI TOSHIAKI (JP)
Application Number:
PCT/JP2023/031323
Publication Date:
March 07, 2024
Filing Date:
August 29, 2023
Export Citation:
Assignee:
TOYO KOHAN CO LTD (JP)
UNIV YAMAGUCHI (JP)
UNIV YAMAGUCHI (JP)
International Classes:
C12Q1/6883; C12Q1/6837; C12Q1/686; G01N33/53
Domestic Patent References:
WO2015045741A1 | 2015-04-02 | |||
WO2019004335A1 | 2019-01-03 | |||
WO2016167317A1 | 2016-10-20 |
Foreign References:
JP2015517798A | 2015-06-25 |
Other References:
YOSHIDA KENICHI, MASARU SANADA, SEIJI OGAWA: "Novel Molecular Mechanism of Myelodysplastic Syndromes", JOURNAL OF THE JAPANESE SOCIETY OF INTERNAL MEDICINE, vol. 101, no. 7, 1 January 2012 (2012-01-01), pages 1994 - 2001, XP093142962
Attorney, Agent or Firm:
HIRAKI & ASSOCIATES (JP)
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