Title:
OPTICAL DEVICE INSPECTION TOOL AND OPTICAL DEVICE INSPECTION METHOD
Document Type and Number:
WIPO Patent Application WO/2013/042585
Kind Code:
A1
Abstract:
When the optical device inspection tool is closed by superimposing the cover on the tool body, a storage area for storing optical lenses is formed therein. When the cover is opened from the tool body, of the side edges forming the lower tool body surface that faces the surface on which the tool is placed, the side edge in the direction of the opening-closing axis on the side of the connection to the cover forms a first beveled surface, and of the side edges forming the lower cover surface that faces the surface on which the tool is placed, the side edge in the direction of the opening-closing axis on the side of the connection to the tool body forms a second beveled surface. By allowing the first and second beveled surfaces to contact the surface on which the tool is placed when the cover is open, the respective lower surfaces of the tool body and the cover are inclined with respect to the surface on which the tool is placed and the open state is maintained.
Inventors:
ITOH TERUHIKO (JP)
Application Number:
PCT/JP2012/073251
Publication Date:
March 28, 2013
Filing Date:
September 12, 2012
Export Citation:
Assignee:
KONICA MINOLTA ADVANCED LAYERS (JP)
ITOH TERUHIKO (JP)
ITOH TERUHIKO (JP)
International Classes:
G01M11/00
Foreign References:
| JP2011013015A | 2011-01-20 | |||
| JP2009198204A | 2009-09-03 | |||
| JP2000171347A | 2000-06-23 |
Attorney, Agent or Firm:
KOYO INTERNATIONAL PATENT FIRM (JP)
Patent business corporation Mitsuaki international patent firm (JP)
Patent business corporation Mitsuaki international patent firm (JP)
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