Title:
OPTICAL INSPECTION DEVICE, LENS, AND OPTICAL INSPECTION METHOD
Document Type and Number:
WIPO Patent Application WO/2017/154945
Kind Code:
A1
Abstract:
An optical inspection device (100) is provided with an LED (101), a chart (102), a collimator (103), and a mirror (111). The LED (101) radiates light to the chart (102) and thereby radiates the light as light rays which are on-axis with respect to the collimator (103). A pattern of the chart (102) is thereby projected to a center part of an image sensor (130) via the collimator (103) and a subject optical system (120). The mirror (111) reflects light radiated to the mirror (111) via the collimator (103) from among the on-axis light rays. The mirror (111) thereby projects the pattern of the chart (102) to a peripheral part of the image sensor (130) via the subject optical system (120).
Inventors:
IKAWA YOSHIHIRO
CHIBA HIRONOBU
UENO YOSHIHIRO
CHIBA HIRONOBU
UENO YOSHIHIRO
Application Number:
PCT/JP2017/009129
Publication Date:
September 14, 2017
Filing Date:
March 08, 2017
Export Citation:
Assignee:
PANASONIC IP MAN CO LTD (JP)
International Classes:
G01M11/02
Domestic Patent References:
| WO2006028183A1 | 2006-03-16 |
Foreign References:
| JP2012078330A | 2012-04-19 | |||
| JP2009150843A | 2009-07-09 | |||
| JP2012093116A | 2012-05-17 | |||
| JPS6227640A | 1987-02-05 | |||
| US20130258313A1 | 2013-10-03 |
Other References:
See also references of EP 3428604A4
Attorney, Agent or Firm:
KAMATA Kenji et al. (JP)
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