Title:
OPTICAL MEASURING DEVICE AND METHOD, NANOPARTICLE MEASURING METHOD AND DEVICE
Document Type and Number:
WIPO Patent Application WO/2006/025158
Kind Code:
A1
Abstract:
An optical measuring device for performing measurement using a transient diffraction grating method through only adjustment of probe light and a nanoparticle measuring device employing a similar principle. The optical measuring device comprises a power supply (15) , a container (11) for hoiding a sample, a pair of electrodes (13, 14) for generating an electric line of force distribution where regions of high electric line of force density and regions of low electric line of force density are arrangeed regularly, a dielectrophoresis control section (19) for controlling the generation of transient diffraction grating utilizing dielectrophoresis of particles in a sample caused by applying a voltage to the paired electrodes (13, 14) and the variation in transient diffraction grating due to diffusion of particles in the sample caused by the variation in applied voltage, a light source (16) for irradiating the transient diffraction grating with light, and a photodetector (18) for detecting light diffracted by the transient diffraction grating. Particles are evaluated from variation in intensity of light diffracted by the transient diffraction grating. The particle diameter of nanoparticles is measured by a similar principle, thus enhancing the signal strength, the sensitivity and the S/N ratio as compared with the dynamic scattering method.
Inventors:
MORIYA NAOJI (JP)
TOTOKI SHINICHIRO (JP)
NAGUMO YUZO (JP)
WADA YUKIHISA (JP)
SAKAUCHI NAOFUMI (JP)
INOUE FUJIO (JP)
TAKEBE MASAHIRO (JP)
MASUTOMI TATSUAKI
TOTOKI SHINICHIRO (JP)
NAGUMO YUZO (JP)
WADA YUKIHISA (JP)
SAKAUCHI NAOFUMI (JP)
INOUE FUJIO (JP)
TAKEBE MASAHIRO (JP)
MASUTOMI TATSUAKI
Application Number:
PCT/JP2005/013189
Publication Date:
March 09, 2006
Filing Date:
July 15, 2005
Export Citation:
Assignee:
SHIMADZU CORP (JP)
MASUTOMI MAKIKO (JP)
MORIYA NAOJI (JP)
TOTOKI SHINICHIRO (JP)
NAGUMO YUZO (JP)
WADA YUKIHISA (JP)
SAKAUCHI NAOFUMI (JP)
INOUE FUJIO (JP)
TAKEBE MASAHIRO (JP)
MASUTOMI MAKIKO (JP)
MORIYA NAOJI (JP)
TOTOKI SHINICHIRO (JP)
NAGUMO YUZO (JP)
WADA YUKIHISA (JP)
SAKAUCHI NAOFUMI (JP)
INOUE FUJIO (JP)
TAKEBE MASAHIRO (JP)
International Classes:
G01N21/47; G01N15/02
Foreign References:
| JP2004085528A | 2004-03-18 | |||
| JP3396241B2 | 2003-04-14 | |||
| US5215883A | 1993-06-01 |
Other References:
YAMAGUCHI O. ET AL: "Influence of the number of functional group bonded to sillicon on organogilane self assembled film formation", THE 65TH AUTUMN MEETING, 2004 THE JAPAN SOCIETY OF APPLIED PHYSICS, no. 3, 1 September 2004 (2004-09-01), pages 1141, XP002993284
See also references of EP 1785718A4
See also references of EP 1785718A4
Attorney, Agent or Firm:
Kawasaki, Masaki (Keihan Marquis Umeda 5-5, Nishitemma 4-chome, Kita-k, Osaka-shi Osaka 47, JP)
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