Title:
PARTICLE BEAM IRRADIATION SYSTEM AND IRRADIATION PLANNING DEVICE
Document Type and Number:
WIPO Patent Application WO/2019/163291
Kind Code:
A1
Abstract:
This particle beam irradiation system is provided with: a target monitoring device for measuring the position of a target 26; and a control system 7 which performs tracking irradiation and gate irradiation, the tracking irradiation including correcting an excitation current value of scanning electromagnets 31, 32 on the basis of a signal from the target monitoring device and irradiating the target 26 with a charged particle beam, and the gate irradiation including computing the depth of the target 26 on the basis of the signal from the target monitoring device and emitting the charged particle beam when the depth of the target 26 is within a predetermined allowable depth range. The control system 7 performs the tracking irradiation when the depth of the target 26 measured by the target monitoring device is within the allowable depth range. Accordingly, the scanning irradiation-based particle beam irradiation system can form a dose distribution according to plan, and shorten the irradiation time compared to conventional techniques.
Inventors:
UMEGAKI KIKUO (JP)
FUJII YUSUKE (JP)
FUJIMOTO RINTAROU (JP)
MIYAMOTO NAOKI (JP)
HIRAYAMA SHUSUKE (JP)
SHIMIZU SHINICHI (JP)
FUJII YUSUKE (JP)
FUJIMOTO RINTAROU (JP)
MIYAMOTO NAOKI (JP)
HIRAYAMA SHUSUKE (JP)
SHIMIZU SHINICHI (JP)
Application Number:
PCT/JP2018/048304
Publication Date:
August 29, 2019
Filing Date:
December 27, 2018
Export Citation:
Assignee:
HITACHI LTD (JP)
UNIV HOKKAIDO NAT UNIV CORP (JP)
UNIV HOKKAIDO NAT UNIV CORP (JP)
International Classes:
A61N5/10
Foreign References:
| JP2016144573A | 2016-08-12 | |||
| JP2013198579A | 2013-10-03 | |||
| JP2012254146A | 2012-12-27 | |||
| JP2017093516A | 2017-06-01 |
Attorney, Agent or Firm:
KAICHI IP (JP)
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