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Title:
PARTICLE MEASUREMENT DEVICE AND PARTICLE MEASUREMENT METHOD
Document Type and Number:
WIPO Patent Application WO/2022/270204
Kind Code:
A1
Abstract:
Provided are a particle measurement device and particle measurement method that make it possible to measure the refractive index or complex refractive index and the particle size distribution of a single type of particle included in a dispersion. This particle measurement device comprises a light source unit that emits measurement light onto a dispersion including a single type of particle, a parameter setting unit that sets at least one from among a scattering angle and measurement wavelength as a measurement parameter, a scattered light measurement unit that obtains a plurality of items of scattering intensity data by changing the set values of the measurement parameter and repeatedly measuring the scattering intensity of scattered light emitted from the dispersion as a result of the measurement light, and a computation unit that calculates time variation characteristic data for the scattering intensity and parameter dependence data for the scattering intensity from the plurality of items of scattering intensity data and determines the refractive index and particle size distribution of the single type of particle by subjecting the calculated time variation characteristic data for the scattering intensity and parameter dependence data for the scattering intensity to fitting using a theoretical formula defining the relationship between the refractive index, particle size, and scattering intensity or a simulation based on electromagnetic wave behavior theory.

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Inventors:
NAKAMURA SOHICHIRO (JP)
HAMADA KENICHI (JP)
Application Number:
PCT/JP2022/021361
Publication Date:
December 29, 2022
Filing Date:
May 25, 2022
Export Citation:
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Assignee:
FUJIFILM CORP (JP)
International Classes:
G01N15/02; G01N21/17; G01N21/27; G01N21/49
Domestic Patent References:
WO2017069260A12017-04-27
WO2011045961A12011-04-21
WO2020096038A12020-05-14
WO2021199797A12021-10-07
Foreign References:
JP2005134205A2005-05-26
JP2020193877A2020-12-03
CN103487356A2014-01-01
JP2017528689A2017-09-28
JP2018031660A2018-03-01
JPH0263181B21990-12-27
Attorney, Agent or Firm:
ITOH Hideaki et al. (JP)
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