Title:
PASSIVE INTERMODULATION DISTORTION MEASURING METHOD AND SYSTEM
Document Type and Number:
WIPO Patent Application WO/2008/029522
Kind Code:
A1
Abstract:
Reception PIM measuring methods for matching the impedances of a sample and the
measuring system have involved problems such as the limitation of the measurement
dynamic range due to the PIM produced at the terminator, the limitation of the
shape and size of the sample under measurement, and the difficulty of the independent
control of the sample shape parameter. A sample under measurement is brought
into a mismatching state, and a standing wave is produced on a transmission line
to which the sample is connected. The end of the transmission line is short-circuited
by the sample, the position of the sample is made the loop of the current standing
wave, and a test signal of high current density is applied. Then the end of the transmission
line is made open, and the system noise is calibrated. Since impedance matching
is not carried out and no terminator is used, a wide measurement dynamic range
is realized without being influenced by the PIM produced at the terminator. The
shape of the sample is much smaller than that of the sample used in conventional
measurement methods, and the shape can be freely selected. The physical properties
of a wide variety of materials such as conductive materials, insulators, and
magnetic materials are possible.
Inventors:
KUGA NOBUHIRO (JP)
YAMAMOTO YASUYUKI (JP)
DOI MITSURU (JP)
ENDO ATSUNORI (JP)
YAMAMOTO YASUYUKI (JP)
DOI MITSURU (JP)
ENDO ATSUNORI (JP)
Application Number:
PCT/JP2007/053438
Publication Date:
March 13, 2008
Filing Date:
February 23, 2007
Export Citation:
Assignee:
UNIV YOKOHAMA NAT (JP)
KUGA NOBUHIRO (JP)
YAMAMOTO YASUYUKI (JP)
DOI MITSURU (JP)
ENDO ATSUNORI (JP)
KUGA NOBUHIRO (JP)
YAMAMOTO YASUYUKI (JP)
DOI MITSURU (JP)
ENDO ATSUNORI (JP)
International Classes:
G01R23/20; G01N22/00; H04B3/46
Foreign References:
| JP7086481B2 | 2022-06-20 | |||
| JPH0943165A | 1997-02-14 | |||
| JP2005121494A | 2005-05-12 |
Other References:
YAMAMOTO Y. ET AL.: "Teizaiha Denso Senro o Mochiita Dotai Zairyo no Sogo Hencho Hizumi Hyoka", IEICE TECHNICAL REPORT, vol. 106, no. 130, 23 June 2006 (2006-06-23), pages 57 - 61, XP008102580
KUGA N. ET AL.: "Microstrip Senro o Mochiita Yudentai Kiban no PIM Tokusei Hyoka", THE TRANSACTIONS OF THE INSTITUTE OF ELECTRONICS, INFORMATION AND COMMUNICATION ENGINERS B, vol. J88-B, no. 4, 1 April 2005 (2005-04-01), pages 841 - 852, XP008102575
YAMAMOTO Y. ET AL.: "Microstrip Senro no Dotai Teiko ni Taisuru PIM Izonsei Hyoka", 2006 NEN IEICE ELECTRONICS SOCIETY TAIKAI KOEN RONBUNSHU 2, 7 September 2000 (2000-09-07), pages 1 + ABSTR. NO. C-5-1, XP008115669
ISAO MINOWA: "Application of nonlinearity measuring method using two frequencies for contacts", IEICE TRANSACTIONS ON ELECTRONICS, vol. J85-C, no. 11, November 1985 (1985-11-01), pages 91 - 924
NOBUHIRO KUGA: "PIM generated in dielectric circuit board that employs microstrip line", IEICE TRANSACTIONS ON COMMUNICATIONS, vol. J88-B, no. 4, April 2005 (2005-04-01), pages 847 - 852
KUGA N. ET AL.: "Microstrip Senro o Mochiita Yudentai Kiban no PIM Tokusei Hyoka", THE TRANSACTIONS OF THE INSTITUTE OF ELECTRONICS, INFORMATION AND COMMUNICATION ENGINERS B, vol. J88-B, no. 4, 1 April 2005 (2005-04-01), pages 841 - 852, XP008102575
YAMAMOTO Y. ET AL.: "Microstrip Senro no Dotai Teiko ni Taisuru PIM Izonsei Hyoka", 2006 NEN IEICE ELECTRONICS SOCIETY TAIKAI KOEN RONBUNSHU 2, 7 September 2000 (2000-09-07), pages 1 + ABSTR. NO. C-5-1, XP008115669
ISAO MINOWA: "Application of nonlinearity measuring method using two frequencies for contacts", IEICE TRANSACTIONS ON ELECTRONICS, vol. J85-C, no. 11, November 1985 (1985-11-01), pages 91 - 924
NOBUHIRO KUGA: "PIM generated in dielectric circuit board that employs microstrip line", IEICE TRANSACTIONS ON COMMUNICATIONS, vol. J88-B, no. 4, April 2005 (2005-04-01), pages 847 - 852
Attorney, Agent or Firm:
TANI, Yoshikazu et al. (Akasaka 2-chome Minato-k, Tokyo 52, JP)
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