Title:
PATTERN FORMING METHOD, MANUFACTURING METHOD FOR ELECTRONIC DEVICE, AND LAMINATED BODY
Document Type and Number:
WIPO Patent Application WO/2017/056828
Kind Code:
A1
Abstract:
Provided are: a pattern forming method with which film thinning is reduced but high resolution can be achieved, especially when an ultra-fine remainder pattern is formed; a manufacturing method for an electronic device, the manufacturing method including the pattern forming method; and a laminated body for forming the pattern. The pattern forming method includes: (a) a step for forming an actinic ray-sensitive or radiation-sensitive film by using an actinic ray-sensitive or radiation-sensitive composition; (b) a step for forming an upper-layer film on the actinic ray-sensitive or radiation-sensitive film by using an upper-layer film forming composition; (c) a step for exposing the actinic ray-sensitive or radiation-sensitive film having formed thereon the upper-layer film; and (d) a step for developing, by using a developer, the actinic ray-sensitive or radiation-sensitive film that has been exposed, wherein the upper-layer film forming composition contains a crosslinking agent. The manufacturing method for an electronic device includes the pattern forming method. The laminated body includes the actinic ray-sensitive or radiation-sensitive film, and the upper-layer film containing a crosslinking agent.
Inventors:
NIHASHI WATARU (JP)
TSUBAKI HIDEAKI (JP)
TSUCHIHASHI TORU (JP)
YAMAMOTO KEI (JP)
TSUBAKI HIDEAKI (JP)
TSUCHIHASHI TORU (JP)
YAMAMOTO KEI (JP)
Application Number:
PCT/JP2016/075389
Publication Date:
April 06, 2017
Filing Date:
August 31, 2016
Export Citation:
Assignee:
FUJIFILM CORP (JP)
International Classes:
G03F7/11; G03F7/20; G03F7/32; G03F7/38; G03F7/038; G03F7/039
Domestic Patent References:
WO2008015969A1 | 2008-02-07 |
Foreign References:
JP2006184575A | 2006-07-13 | |||
JP2006064712A | 2006-03-09 | |||
JP2006023699A | 2006-01-26 | |||
JP2013109279A | 2013-06-06 | |||
JP2002006494A | 2002-01-09 |
Attorney, Agent or Firm:
NAKASHIMA Junko et al. (JP)
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