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Patent Searching and Data


Title:
PERIODONTAL POCKET INSPECTION DEVICE
Document Type and Number:
WIPO Patent Application WO/2018/168314
Kind Code:
A1
Abstract:
The purpose of the present invention is to improve the operability of an inspection probe (10) while miniaturizing the inspection probe. According to the present invention, an inspection probe used in a device for inspecting the depth of a periodontal pocket includes an emission part (10A) and a grip part (10B). The emission part (10A) includes: a crystal deflection element which deflects, in a specific direction, measuring light beams branched from low interference light; and an f-θ lens which parallelizes the deflected measuring light beams. The parallelized measuring light beams (B1) or the like are emitted from an opening (16) of the emission part (10A) and irradiated to the gums or teeth of a subject. An optical tomographic image of the gums or teeth is obtained from an interference signal obtained on the basis of reflected light, and thus the depth of the periodontal pocket can be known. Since the emission part (10A) protrudes further in the emission direction of the measuring light beams (B1) than the grip part (10B), the measuring light beams (B1) can be irradiated perpendicularly to the depth direction of the periodontal pocket without a hand coming into contact with the gums or the like, even when holding the grip part (10B).

Inventors:
SHINDO MIKIO (JP)
Application Number:
PCT/JP2018/005381
Publication Date:
September 20, 2018
Filing Date:
February 16, 2018
Export Citation:
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Assignee:
TANITA SEISAKUSHO KK (JP)
International Classes:
A61B1/24; A61B1/00
Foreign References:
JP2009131313A2009-06-18
JP2013233303A2013-11-21
JP5565910B22014-08-06
Other References:
NAGANUMA, KAZUNOR I: "Realization of high resolution KTN optical beam scanner", NTT TECHNICAL JOURNAL, vol. 21, no. 11, November 2009 (2009-11-01), pages 16 - 19
Attorney, Agent or Firm:
PATENT PROFESSIONAL CORPORATION TOKYO UIT INTERNATIONAL et al. (JP)
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