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Patent Searching and Data


Title:
PHOTOVOLTAIC ARRAY TEST METHOD AND SYSTEM
Document Type and Number:
WIPO Patent Application WO/2024/065211
Kind Code:
A1
Abstract:
The present application provides a photovoltaic array test method and a system, the method being applied to a photovoltaic array test system. The photovoltaic array test method comprises: obtaining a quantity of photovoltaic branches connected in a photovoltaic array; determining a reference electrical parameter according to the quantity of photovoltaic branches and electrical parameters of the photovoltaic branches; if the photovoltaic array is electrically connected to the photovoltaic array test system, monitoring a test electrical parameter of the photovoltaic array; determining a test result of the photovoltaic array according to the test electrical parameter and the reference electrical parameter.

Inventors:
LIU DIPING (CN)
LIN LONGZHEN (CN)
YAN YU (CN)
Application Number:
PCT/CN2022/121866
Publication Date:
April 04, 2024
Filing Date:
September 27, 2022
Export Citation:
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Assignee:
CONTEMPORARY AMPEREX TECHNOLOGY CO LTD (CN)
International Classes:
H02S50/10
Foreign References:
CN207543070U2018-06-26
CN113708726A2021-11-26
KR101402045B12014-06-03
CN111342772A2020-06-26
CN107733357A2018-02-23
CN113872526A2021-12-31
CN209964016U2020-01-17
CN109936335A2019-06-25
CN214045571U2021-08-24
Attorney, Agent or Firm:
BEIJING WEIFEI LIANCHUANG INTELLECTUAL PROPERTY AGENCY CO., LTD. (CN)
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