Title:
PHYSICAL QUANTITY MEASURING METHOD, TEMPERATURE MEASURING METHOD BY INFRARED THERMOMETER, PHYSICAL QUANTITY MEASURING DEVICE, AND INFRARED THERMOMETER
Document Type and Number:
WIPO Patent Application WO/2003/016845
Kind Code:
A1
Abstract:
A measuring device in which a sensor output of an analog voltage signal from a sensor (7) for a measured object physical quantity outputted from an measured object (6) is inputted through a multiplexer (8) and an operational amplifier (4) to an integration circuit (2), the time till the quantity of charge released from the integration circuit (2) reaches a threshold value presented by a reference voltage in a comparator circuit (9) is measured, this time is inputted from a CPU (1) to an EE−ROM (3) holding an intrinsic function, and an eigenfunction suited for the characteristics of an electronic part used in a control circuit is defined. A highly precise voltage signal processing system having an A&sol D conversion function can be constructed.
Inventors:
SAKANO KAZUHITO (JP)
Application Number:
PCT/JP2001/006940
Publication Date:
February 27, 2003
Filing Date:
August 10, 2001
Export Citation:
Assignee:
SAKANO KAZUHITO (JP)
International Classes:
G01J5/04; G01K13/00; (IPC1-7): G01J5/14; G01R19/255
Domestic Patent References:
| WO2000004353A1 | 2000-01-27 |
Foreign References:
| JPS57196621A | 1982-12-02 | |||
| JP2000266773A | 2000-09-29 |
Attorney, Agent or Firm:
Kaiguchi, Muneaki (17-3 Shibuya 2-chom, Shibuya-ku Tokyo, JP)
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