Title:
POLARIZATION MODE DISPERSION MEASURING METHOD AND POLARIZATION MODE DISPERSION MEASURING SYSTEM
Document Type and Number:
WIPO Patent Application WO/2001/069196
Kind Code:
A1
Abstract:
In order for a simple configuration based on a fixed analyzer method to measure smaller PMD values, a reference substance gives a specified polarization mode dispersion to a linearly polarized light extracted by a first polarizer from a wide-band light emitted from a wide-band light source. The plane of polarization of the specified-polarization-mode-dispersion-imparted light is rotated by a polarization-plane rotor and the spectrum of a linearly polarized light extracted by a second polarizer from light emitted from the other edge side of an object to be measured is analyzed to thereby obtain at least one of the maximum and minimum values of polarization mode dispersion. A value based on the difference between the maximum and minimum values of the polarization mode dispersion, or the difference between the maximum value and a specified polarization mode dispersion value based on the reference substance, or the difference between the minimum value and a specified polarization mode dispersion value based on the reference substance is calculated as the polarization mode dispersion value of the object to be measured.
Inventors:
YAMAGUCHI SHIROU (JP)
Application Number:
PCT/JP2001/001976
Publication Date:
September 20, 2001
Filing Date:
March 13, 2001
Export Citation:
Assignee:
ANRITSU CORP (JP)
YAMAGUCHI SHIROU (JP)
YAMAGUCHI SHIROU (JP)
International Classes:
G01M11/00; G01J4/04; G01M11/02; (IPC1-7): G01M11/02
Foreign References:
| JPH0829293A | 1996-02-02 | |||
| JPH0634446A | 1994-02-08 |
Attorney, Agent or Firm:
Suzuye, Takehiko c/o SUZUYE & SUZUYE 7-2 (Kasumigaseki 3-chome Chiyoda-ku, Tokyo, JP)
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