Title:
POLARIZED MATERIAL INSPECTION APPARATUS AND SYSTEM
Document Type and Number:
WIPO Patent Application WO2005065293
Kind Code:
A3
Abstract:
A polarized material inspection device that includes a light source (12), a first polarizing filter (14) disposed within the optical path of the light source (12), a frame (16) into which a second polarizing filter (18) is disposed, and a support (20) for positioning the frame (16) such that an object may be viewed through the second polarizing filter (18). In the preferred embodiment, the first polarizing filter (14) is rotatable through a ninety degree arc such that planes of polarization may be adjusted to be parallel or orthogonal to one another. The preferred embodiment also includes a light illumination assembly having a rotatably mounted linear polarizer at the polarizing output end. This light assembly is attached to a portion of the frame and may be adjusted such that the beam of light is directed to the desired portion of the surface. Within the frame is mounted a fixed linear polarizing filter of sufficient size to allow the entire illuminated surface to be viewed. The frame is mounted to an adjustable support arm that is attached to a tripod or other support to allow the apparatus to be fixed during a given procedure.
Inventors:
KARP JOHN (US)
PELLETIER DOMINIC (US)
PELLETIER DOMINIC (US)
Application Number:
PCT/US2004/043544
Publication Date:
March 09, 2006
Filing Date:
December 28, 2004
Export Citation:
Assignee:
SYRIS SCIENT L L C (US)
KARP JOHN (US)
PELLETIER DOMINIC (US)
KARP JOHN (US)
PELLETIER DOMINIC (US)
International Classes:
(IPC1-7): G01J4/00
Foreign References:
| US6055053A | 2000-04-25 |
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