Title:
POLARIZING MICROSCOPE, CRYSTAL DEFECT EVALUATION DEVICE, AND CRYSTAL DEFECT EVALUATION METHOD
Document Type and Number:
WIPO Patent Application WO/2023/162425
Kind Code:
A1
Abstract:
A polarizing microscope 1 comprises a sample stage 4 for carrying a sample 8, a polarizer 3 provided on a light source side of the sample 8, and an analyzer 6 provided on a viewing side of the sample 8. The polarizer 3 and/or the analyzer 6 is installed so that the polarization direction thereof is inclined relative to the optical main axis of the sample 8, or installed so that the angle formed by the polarization direction of the analyzer 6 and the polarization direction of the polarizer 3 is other than a right angle.
Inventors:
HARADA SHUNTA (JP)
MATSUBARA YASUTAKA (JP)
MURAYAMA KENTA (JP)
MIZUTANI SEIYA (JP)
MIZUTANI SEIJI (JP)
MIZUTANI YUYA (JP)
MATSUBARA YASUTAKA (JP)
MURAYAMA KENTA (JP)
MIZUTANI SEIYA (JP)
MIZUTANI SEIJI (JP)
MIZUTANI YUYA (JP)
Application Number:
PCT/JP2022/046752
Publication Date:
August 31, 2023
Filing Date:
December 19, 2022
Export Citation:
Assignee:
NATIONAL UNIV CORPORATION TOKAI NATIONAL HIGHER EDUCATION AND RESEARCH SYSTEM (JP)
MIPOX CORP (JP)
MIPOX CORP (JP)
International Classes:
G02B21/00; G01J1/04; G02B21/36
Domestic Patent References:
| WO2009044834A1 | 2009-04-09 | |||
| WO2018207569A1 | 2018-11-15 |
Foreign References:
| JP3207764U | 2016-12-01 |
Attorney, Agent or Firm:
MORISHITA Sakaki (JP)
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