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Patent Searching and Data


Title:
POSITION MEASUREMENT METHOD, POSITION MEASUREMENT DEVICE, AND PROGRAM
Document Type and Number:
WIPO Patent Application WO/2010/001940
Kind Code:
A1
Abstract:
In a position measurement technique of measuring the photographed position or posture and the three-dimensional position of a subject to be photographed according to a moving image, an error is to be reduced.  Provided is a position measurement method which comprises an external standardization element correcting step (S11) of correcting an external standardization element calculated in a step (S10) according to the difference between the photographing timing of the image and the acquisition timing of a photographing position and/or photographing posture given from outside, a bundle adjustment step (S12) of bundle-adjusting external standardization elements and the three-dimensional coordinate of feature points of one or more images at the same time according to the external standardization element corrected in the step (S11), a three-dimensional coordinate calculating step (S13) of calculating the three-dimensional coordinate of a feature point newly detected in an area with less density of the feature points in the images according to the bundle-adjusted external standardization elements, and a step of repeating the processing from the step (S10) to the step (S13) until the final image is obtained.

Inventors:
ANAI TETSUJI (JP)
KOCHI NOBUO (JP)
FUKAYA NOBUYUKI (JP)
Application Number:
PCT/JP2009/062067
Publication Date:
January 07, 2010
Filing Date:
July 01, 2009
Export Citation:
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Assignee:
TOPCON CORP (JP)
ANAI TETSUJI (JP)
KOCHI NOBUO (JP)
FUKAYA NOBUYUKI (JP)
International Classes:
G01C11/06; G01B11/00
Foreign References:
JP2008089314A2008-04-17
JP2007322170A2007-12-13
JP2007147522A2007-06-14
JP2005338107A2005-12-08
JP2007171048A2007-07-05
JP2006250917A2006-09-21
JP2007147457A2007-06-14
JP2007183256A2007-07-19
Other References:
HIROTSUGU YOKOJI, JOURNAL OF INFORMATION PROCESSING SOCIETY OF JAPAN, vol. 0, no. 13, pages 1 - 11
SHUNJI MURAI, ANALYTICAL PHOTOGRAMMETRY, pages 46 - 51,149-155
Attorney, Agent or Firm:
SUENARI, Mikio (JP)
End 成 Mikio (JP)
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