Title:
PROBE BLOCK ASSEMBLY FOR INSPECTING DISPLAY PANEL, CONTROL METHOD THEREOF, AND DISPLAY PANEL INSPECTING APPARATUS
Document Type and Number:
WIPO Patent Application WO/2021/002572
Kind Code:
A1
Abstract:
A probe block assembly for inspecting a display panel, according to the present invention, may comprise: a plurality of probe blocks being in contact with a plurality of electrode pads of a display panel so as to inspect whether there is a defect, the display panel having been moved to an inspection position by the position-shifting of a mother panel; and a probe unit for supporting the plurality of probe blocks, wherein the plurality of probe blocks include probe pins being in contact with the plurality of electrode pads, respectively, and, in order to perform an inspection on the display panel, a probe block is selected from among the probe blocks loaded into a probe block loading unit, and is then withdrawn and mounted at a predetermined position on the probe unit which is disposed at a position where an inspection to determine whether the display panel is defective is performed.
Inventors:
PARK NOH SUN (KR)
PARK JEAN (KR)
CHO CHANG JE (KR)
LEE DONG IN (KR)
PARK JEAN (KR)
CHO CHANG JE (KR)
LEE DONG IN (KR)
Application Number:
PCT/KR2020/004967
Publication Date:
January 07, 2021
Filing Date:
April 13, 2020
Export Citation:
Assignee:
WOORI MICRON INC (KR)
International Classes:
G09G3/00; G01R1/073; G01R31/28; H01L51/00
Foreign References:
| KR20170053352A | 2017-05-16 | |||
| KR101035570B1 | 2011-05-19 | |||
| KR20010020825A | 2001-03-15 | |||
| KR20180041891A | 2018-04-25 | |||
| KR101545844B1 | 2015-08-20 | |||
| KR102097455B1 | 2020-04-07 | |||
| KR102097456B1 | 2020-04-07 |
Attorney, Agent or Firm:
LIM, Sang Yeob (KR)
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