Title:
PROBE CARD
Document Type and Number:
WIPO Patent Application WO/2023/096242
Kind Code:
A1
Abstract:
A probe card according to various embodiments of the present disclosure may comprise: a probe pin; and a guide part which is disposed at the outer edge of the circumference of the probe pin and comprises a guide opening into which one end and the other end of the probe pin are inserted and a space part in which at least a part of the probe pin is disposed, wherein the probe pin comprises: two probe tips formed at the one end and the other end of the probe pin to be symmetrical to each other and contacting an object to be inspected and a printed circuit board, respectively; support parts extending from the two probe tips, respectively, wherein the longitudinal length of each of the support parts is longer than the width of the guide opening; and two outer extension parts extending from the one support part to the other support part and formed to be symmetrical to each other with reference to a virtual straight line connecting the two probe tips.
Inventors:
AN SEUNGBAE (KR)
Application Number:
PCT/KR2022/017892
Publication Date:
June 01, 2023
Filing Date:
November 14, 2022
Export Citation:
Assignee:
TSE CO LTD (KR)
International Classes:
G01R1/073; G01R1/067; G01R31/28
Foreign References:
KR20110112824A | 2011-10-13 | |||
KR20180094627A | 2018-08-24 | |||
JP2007205861A | 2007-08-16 | |||
JP2017036959A | 2017-02-16 | |||
KR20160142644A | 2016-12-13 |
Attorney, Agent or Firm:
YOON & LEE INTERNATIONAL PATENT & LAW FIRM (KR)
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