Title:
PROBE FOR DEEP TEMPERATURE MEASUREMENT AND DEEP THERMOMETER
Document Type and Number:
WIPO Patent Application WO/2024/004375
Kind Code:
A1
Abstract:
In the present invention, a probe 1 for deep temperature measurement used to measure the temperature of the depth of a subject 9 comprises a plate-shaped substrate 10, a pair of first area temperature sensors 21, 22 mounted on a first area 11 of the substrate so as to face each other across the substrate 10, and a pair of second area temperature sensors 23, 24 mounted on a second area 12 of the substrate so as to face each other across the substrate 10. A through hole 15 penetrating between the observe surface 10a and the reverse surface 10b of the substrate 10 immediately below the first area temperature sensors 21, 22 is formed in the substrate 10, and the through hole 15 connects between the pair of first area temperature sensors 21, 22. The probe 1 for deep temperature measurement makes it possible to measure the temperature of the depth of a subject at a high accuracy, even if the thickness of the substrate constituting the probe is reduced.
Inventors:
HASHIMOTO NOBUAKI (JP)
Application Number:
PCT/JP2023/017069
Publication Date:
January 04, 2024
Filing Date:
May 01, 2023
Export Citation:
Assignee:
PUBLIC UNIV CORPORATION SUWA UNIV OF SCIENCE FOUNDATION (JP)
International Classes:
A61B5/01; G01K7/42; G01K13/20
Domestic Patent References:
| WO2016143518A1 | 2016-09-15 | |||
| WO2016143529A1 | 2016-09-15 |
Foreign References:
| JP2022521735A | 2022-04-12 |
Attorney, Agent or Firm:
MIYASAKA Kazuhiko (JP)
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