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Title:
PROBE FOR ENERGIZATION TEST
Document Type and Number:
WIPO Patent Application WO/2007/017955
Kind Code:
A1
Abstract:
A probe, comprising a plate-like main body part having a base end fitted to a support base plate and a tip on the opposite side of the base end and manufactured of a tough material and a needle tip part disposed at the tip of the main body part and having a needle tip brought into contact with the electrode of a tested body. The main body part comprises conductive materials extending from the base end to the tip and at least partly buried in the tough material. The tough material comprises a toughness higher than that of the conductive materials, and the conductive materials comprise a conductivity higher than that of the tough material. Thus, the disturbance of signals provided through the probe can be reduced without impairing the elastic deformation of the probe.

Inventors:
HIRAKAWA HIDEKI (JP)
SOMA AKIRA (JP)
HAYASHIZAKI TAKAYUKI (JP)
KUNIYOSHI SHINJI (JP)
TAZAWA MASAHISA (JP)
Application Number:
PCT/JP2005/014871
Publication Date:
February 15, 2007
Filing Date:
August 09, 2005
Export Citation:
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Assignee:
NIHON MICRONICS KK (JP)
HIRAKAWA HIDEKI (JP)
SOMA AKIRA (JP)
HAYASHIZAKI TAKAYUKI (JP)
KUNIYOSHI SHINJI (JP)
TAZAWA MASAHISA (JP)
International Classes:
G01R1/073
Foreign References:
JP2004340617A2004-12-02
JP2001337110A2001-12-07
JP2004150874A2004-05-27
JP2000111577A2000-04-21
JPH11162270A1999-06-18
JP2000338131A2000-12-08
Attorney, Agent or Firm:
MATSUNAGA, Nobuyuki et al. (7F 16-4, Toranomon 1-chom, Minato-ku Tokyo 01, JP)
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