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Patent Searching and Data


Title:
PROBE MEMBER FOR INSPECTION, AND MANUFACTURING METHOD THEREFOR
Document Type and Number:
WIPO Patent Application WO/2023/277524
Kind Code:
A1
Abstract:
A probe member for inspection, according to one embodiment of the present invention, comprises: a contact part having one side formed to be sharp and of a first metal, so as to be in contact with an object to be inspected; and a body part formed, at the other side of the contact part, of a second metal, wherein the body part includes a lateral surface on which a recessed part having a second diameter that is less than the first diameter of the contact part is formed, and the contact part and the body part are formed in separate processes, and thus have an interface formed therebetween.

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Inventors:
BAEK JUNG GYUN (KR)
Application Number:
PCT/KR2022/009229
Publication Date:
January 05, 2023
Filing Date:
June 28, 2022
Export Citation:
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Assignee:
BAEK JUNG GYUN (KR)
International Classes:
G01R1/067; G01R3/00; G01R31/28
Foreign References:
KR20190010674A2019-01-30
KR20060054069A2006-05-22
KR101439342B12014-09-16
JP2006003346A2006-01-05
JP2010151732A2010-07-08
Attorney, Agent or Firm:
YOU ME PATENT AND LAW FIRM (KR)
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