Title:
PROBE PIN, PROBE CARD COMPRISING PROBE PIN, AND METHODS FOR MANUFACTURING SAME
Document Type and Number:
WIPO Patent Application WO/2024/085537
Kind Code:
A1
Abstract:
According to the present invention, the flexibility of a probe pin is adjusted by providing a vertical slit and/or a horizontal slit, thereby facilitating elastic deformation. In addition, according to the present invention, the sectional area of the probe pin is adjusted, thereby improving high-frequency signal characteristics thereof. In addition, according to the present invention, a probe pin can be easily inserted into upper and lower plates by using multiple spacing bodies which are spaced apart by a vertical slit and/or a horizontal slit, and the inserted probe pin is prevented from detaching.
Inventors:
SONG BYUNG CHANG (KR)
KIM DONG IL (KR)
SHIM YUN HEE (KR)
CHO SOO HO (KR)
KIM DONG IL (KR)
SHIM YUN HEE (KR)
CHO SOO HO (KR)
Application Number:
PCT/KR2023/015749
Publication Date:
April 25, 2024
Filing Date:
October 12, 2023
Export Citation:
Assignee:
AMST CO LTD (KR)
International Classes:
G01R1/067; G01R1/073; G01R3/00
Foreign References:
| KR20120050193A | 2012-05-18 | |||
| KR102191759B1 | 2020-12-16 | |||
| KR20090009665A | 2009-01-23 | |||
| KR102164373B1 | 2020-10-12 | |||
| US11460486B1 | 2022-10-04 |
Attorney, Agent or Firm:
CHOI, Kwang Seok (KR)
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