Title:
PROBE PIN FOR INSPECTION APPARATUS
Document Type and Number:
WIPO Patent Application WO/2023/200094
Kind Code:
A1
Abstract:
A probe pin according to an embodiment of the present invention comprises: an upper plunger including a first tip configured to be in contact with a circuit to be inspected to transmit and receive an electrical signal to and from the circuit to be inspected; a lower plunger including a second tip configured to be in contact with an inspection circuit to transmit and receive an electrical signal to and from the inspection circuit; and an elastic unit arranged between the upper plunger and the lower plunger and configured to elastically support the upper plunger and the lower plunger. The upper plunger, the lower plunger, and the elastic unit are manufactured into an integrated pin through 3D printing and are made of one or more metal materials.
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Inventors:
CHOI JONG KOOK (KR)
Application Number:
PCT/KR2023/001832
Publication Date:
October 19, 2023
Filing Date:
February 08, 2023
Export Citation:
Assignee:
QUALMAX INC (KR)
International Classes:
G01R1/067; B33Y70/00; B33Y80/00; G01R3/00
Foreign References:
| KR20170119469A | 2017-10-27 | |||
| KR20210111774A | 2021-09-13 | |||
| KR101194520B1 | 2012-10-24 | |||
| KR101962644B1 | 2019-03-28 | |||
| KR101388878B1 | 2014-04-28 |
Attorney, Agent or Firm:
HANSUNG INTELLECTUAL PROPERTY (KR)
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